> >>>EKD-HT

EKD-HT

EKD-HT Expand

EKD-HT

Dual elements probe OL 0° soft face HT. Shielding fit an automated scan. Probe uses for inspection, characterization and research of defects on steel with a fine structure for high temperature (up to 200°C). Probe supplied with its certificate of compliance EN 12668-2
ImageReferencePriceAdd to cart
EKD4-10-HT-To see the price
Log in
More info

Dual elements probe OL 0° soft face. Piezo-electric crystal size : 3,5x10mm and nominal frequency : 4MHz. Output Connector Lemo00. Shielding fit an automated scan. Probe uses for inspection, characterization and research of defects on steel with a fine structure for high temperature (up to 200°C).

Probe supplied with its certificate of compliance EN 22232-2

EKD2-10-HT-To see the price
Log in
More info

Dual elements probe OL 0° soft face. Piezo-electric crystal size : 3,5x10mm and nominal frequency : 2MHz. Output Connector Lemo00. Shielding fit an automated scan. Probe uses for inspection, characterization and research of defects on steel with a fine structure for high temperature (up to 200°C).

Probe supplied with its certificate of compliance EN 22232-2

images non contractuelles / non contractual pictures

    3 other products in the same category:

    THEY TRUST US

    logo OnetLogo MistrasExxon MobilCEASNCFEDFInstitut de SoudureAIRBUSAir LiquideSchlumberger

    Accept

    This Site uses cookies to improve your user experience