EK-H

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EK-H

Single element membrane probe OL 0° hard face. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces
Probes supplied with its certificate of compliance EN 12668-2
ImageReferenceCeramicFrequencyPriceAdd to cart
EK2.25H25-Ø252,25To see the price
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Single element probe OL 0° hard face. Piezo-electric crystal of diameter : 1" and nominal frequency : 2,25MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces. Connector Lemo 1

Probes supplied with its certificate of compliance EN 22232-2

EK2H10-Ø102To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 10mm and nominal frequency : 2MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK2H20-Ø202To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 20mm and nominal frequency : 2MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK2H24-Ø242To see the price
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Single element probe OL 0° hard face. Piezo-electric crystal of diameter : 24mm and nominal frequency : 2MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces. Connector Lemo1

Probes supplied with its certificate of compliance EN 22232-2

EK4H10-Ø104To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 10mm and nominal frequency : 4MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK4H24-Ø244To see the price
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Single element probe OL 0° hard face. Piezo-electric crystal of diameter : 24mm and nominal frequency : 4MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces. Connector Lemo 1

Probes supplied with its certificate of compliance EN 22232-2

EK5H5-Ø55To see the price
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Single element membrane probe OL 0° hard face. Piezo-electric crystal of diameter : 5mm and nominal frequency : 5MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK4H20-Ø204To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 10mm and nominal frequency : 4MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK10H5-Ø510To see the price
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Single element membrane probe OL 0° hard face. Piezo-electric crystal of diameter : 5mm and nominal frequency : 10MHz. Microdot connector. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK1H20-Ø201To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 20mm and nominal frequency : 1MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK5H10-Ø105To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 10mm and nominal frequency : 5MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK5H20-Ø205To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 20mm and nominal frequency : 5MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK2.25H10-Ø102,25To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 10mm and nominal frequency : 2.25MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

EK2.25H25_0001---To see the price
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Single-element OL 0° hard front face probe, piezoelectric ceramic with 1'' diameter and 2,25MHz nominal frequency. probe used for the control of medium thickness parts. Examination of materials with rough or machined surface. Lemo00 connector in cylindrical case

probe sold with its associated EN 22232-2 plug.

EK2.25H25_0002---To see the price
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Single element probe OL 0° hard face. Piezo-electric crystal of diameter : 1" and nominal frequency : 2,25MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces. Connector Lemo 00

Probes supplied with its certificate of compliance EN 22232-2

EK4H13---To see the price
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Single element  probe OL 0° hard face. Piezo-electric crystal of diameter : 13mm and nominal frequency : 4MHz. Probe uses for inspection of materials with fine or coarse structure. Inspection of rough or machined surfaces

Probes supplied with its certificate of compliance EN 22232-2

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